Senior Metrology Engineer - FIB/SEM & 3D NAND

Micron Technology, Inc. in Singapore seeks a seasoned semiconductor metrology engineer to lead development of advanced metrology applications for 3D NAND, with emphasis on FIB and AFM/SEM/WLI techniques. You will drive qualification, deployment, and collaboration with Process Integration, Yield Enhancement, Process Development Engineering, and Manufacturing to accelerate learning, close inline gaps, and improve device reliability and yield. J-18808-Ljbffr